Comments (6)
I am bit confused with lines a-d above. Could you possible to provide each separately and the behaviour actual/expected?
Looking at it, seems like line d should fix what you are seeing but the start of the test sets the outputs to 0 also.
from ci-test-shield.
sorry for unclear description. There's 2 ways to fix the issue.
1st way (I called plan A)
Just added a while loop at beginning withno line d. I could not observe the loop taking longer time than 100ms actually.
while(ain.read()>0.0f){ //line b, actually the loop only run once on xxxM066
wait(0.1); // plan A : the effective delay is required for xxxM066. 7/12 - ren
}
2nd way (I called plan B)
It's the alternative fix of above while loop. line d only is added instead of the while loop.
from ci-test-shield.
@mray19027
from ci-test-shield.
@soramame21 what platform are you testing this on? This is the first time we've seen this issue.
It may be worth adding a corner case test to catch this. Either way if the platform cannot meet the current testing infrastructure it needs to have a warning on its platform page about limitations on its AnalogIn speed.
from ci-test-shield.
@BlackstoneEngineering This is a pre-release platform working with 5v not 3.3v. the ci-test-shield is modified specially, it's quite different from others. I think we may not need to make further investigation on it. I'd like to close this issue. What is your comment or suggestion?
from ci-test-shield.
@BlackstoneEngineering I close it now. if it's necessary to go deeper, we can reopen it.
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Related Issues (20)
- Docs - add explanation of difference between FAIL and ERROR cases HOT 1
- ci-test for ST platform in latest mbed OS 5.4 HOT 10
- mbed HDK link of README is broken HOT 1
- MBED_CONF_APP_DIO_X not well named for PWM tests HOT 2
- Consider adding a time keeping device HOT 3
- Feature: Simulatenous drivers testing HOT 5
- Request to improve the PWM tests in order to support single edge trigger MCUs. HOT 8
- Prepare repository for production releases HOT 3
- I2C-EEProm write failed because it requires a little delay HOT 3
- NCS36510 target overrides not released
- mBed-HDK link has moved.
- Issues / proposals for handling NC Pins
- Large number of failures a result of trying to test/use too many pins HOT 1
- Linking error due to Block Drivers now being included in Mbed HOT 1
- tests-api-analogin : value read max value limitation
- Production/Alternate test header
- tests-api-spi fails to compile HOT 1
- I2CEeprom ARMC6 compilation failed with mbed-os master HOT 10
- Correct deprecated API HOT 6
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